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  • Liu, An-Wen Hefei National Laboratory for Physical Sciences at Microscale, University of Science and Technology of China, Hefei 230026, China; Song, Ke-Feng Hefei National Laboratory for Physical Sciences at Microscale, University of Science and Technology of China, Hefei 230026, China; Mikhailenko, Semen N. Laboratory of Theoretical Spectroscopy, V.E. Zuev Institute of Atmospheric Optics, SB RAS, 1, Akademician Zuev Square, 634021 Tomsk, Russia; Hu, Shui-Ming Hefei National Laboratory for Physical Sciences at Microscale, University of Science and Technology of China, Hefei 230026, China; Ni, Hong-Yu Hefei National Laboratory for Physical Sciences at Microscale, University of Science and Technology of China, Hefei 230026, China; Vasilenko, Irina A. Laboratory of Theoretical Spectroscopy, V.E. Zuev Institute of Atmospheric Optics, SB RAS, 1, Akademician Zuev Square, 634021 Tomsk, Russia; Naumenko, Olga V. Laboratory of Theoretical Spectroscopy, V.E. Zuev Institute of Atmospheric Optics, SB RAS, 1, Akademician Zuev Square, 634021 Tomsk, Russia olga@asd.iao.ru (2015-01-09)
  • Wan, Jun Department of Physics and Astronomy, University of Delaware, Newark, DE 19716, USA; Bonder, Michael J. Department of Physics and Astronomy, University of Delaware, Newark, DE 19716, USA bonder@physics.udel.edu; Huang, Yunhe Department of Physics and Astronomy, University of Delaware, Newark, DE 19716, USA; Hadjipanayis, George C. Department of Physics and Astronomy, University of Delaware, Newark, DE 19716, USA hadji@udel.edu; Ni, Chaoying Department of Materials Science and Engineering, University of Delaware, Newark, DE 19716, USA (2015-01-15)
  • Zhou, Xun School of Chemical Engineering of Hefei University of Technology, Hefei 230009, PR China; Zhou, Haiou School of Chemical Engineering of Hefei University of Technology, Hefei 230009, PR China School of Materials and Chemical Engineering of Anhui University of Architecture, Hefei 230901, PR China; Wu, Jing School of Chemical Engineering of Hefei University of Technology, Hefei 230009, PR China; Shi, Tiejun School of Chemical Engineering of Hefei University of Technology, Hefei 230009, PR China stjhfut@163.com (2015-01-13)
  • You, Yu Institute for Materials Research, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan; Goto, Takashi Institute for Materials Research, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan; Tu, Rong Institute for Materials Research, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan; Ito, Akihiko Institute for Materials Research, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan itonium@imr.tohoku.ac.jp (2015-01-19)
  • Zhu, Xuebin Key Laboratory of Materials Physics, Institute of Solid State Physics, Chinese Academy of Sciences, Hefei 230031, People’s Republic of China Institute for Superconducting and Electronic Materials, University of Wollongong, Wollongong, NSW 2522, Australia xbzhu@issp.ac.cn; Yeoh, Weikong Australian Key Centre for Microscopy and Microanalysis, University of Sydney, Sydney, NSW 2006, Australia; Li, Wenxian Institute for Superconducting and Electronic Materials, University of Wollongong, Wollongong, NSW 2522, Australia; Li, Qi Institute for Superconducting and Electronic Materials, University of Wollongong, Wollongong, NSW 2522, Australia; Wang, Lin Institute for Superconducting and Electronic Materials, University of Wollongong, Wollongong, NSW 2522, Australia; Shi, Dongqi Institute for Superconducting and Electronic Materials, University of Wollongong, Wollongong, NSW 2522, Australia; Dou, Shixue Institute for Superconducting and Electronic Materials, University of Wollongong, Wollongong, NSW 2522, Australia; Chen, Zhixin School of Mechanical, Materials and Mechatronic Engineering, University of Wollongong, Wollongong, NSW 2522, Australia; Kong, Chunxiu Electron Microscope Unit, University of New South Wales, NSW 2052, Sydney, Australia; Sun, Yuping Key Laboratory of Materials Physics, Institute of Solid State Physics, Chinese Academy of Sciences, Hefei 230031, People’s Republic of China; Zheng, Rongkun Australian Key Centre for Microscopy and Microanalysis, University of Sydney, Sydney, NSW 2006, Australia (2015-01-23)
  • Rousset, B. UMR-E CEA/UJF-Grenoble 1, INAC, SBT, 17 rue des Martyrs, 38054 Grenoble, France bernard.rousset@cea.fr; Lagier, B. UMR-E CEA/UJF-Grenoble 1, INAC, SBT, 17 rue des Martyrs, 38054 Grenoble, France; Hoa, C. UMR-E CEA/UJF-Grenoble 1, INAC, SBT, 17 rue des Martyrs, 38054 Grenoble, France; Vallcorba, R. UMR-E CEA/UJF-Grenoble 1, INAC, SBT, 17 rue des Martyrs, 38054 Grenoble, France (2015-01-09)
  • Parvizi, R. Photonics Laboratory, Department of Physics, University of Malaya, Kuala Lumpur 50603, Malaysia parvizi1360@gmail.com; Ahmad, H. Photonics Laboratory, Department of Physics, University of Malaya, Kuala Lumpur 50603, Malaysia; Arof, H. Department of Electrical Engineering, Faculty of Engineering, University of Malaya, Kuala Lumpur 50603, Malaysia; Ali, N.M. Department of Electrical Engineering, Faculty of Engineering, University of Malaya, Kuala Lumpur 50603, Malaysia; Harun, S.W. Photonics Laboratory, Department of Physics, University of Malaya, Kuala Lumpur 50603, Malaysia Department of Electrical Engineering, Faculty of Engineering, University of Malaya, Kuala Lumpur 50603, Malaysia swharun@um.edu.my (2015-01-09)
  • Ehling, C. Institut für Physikalische Elektronik (ipe), Universität Stuttgart, Pfaffenwaldring 47, 70569 Stuttgart, Germany christian.ehling@ipe.uni-stuttgart.de; Rostan, P.J. Institut für Physikalische Elektronik (ipe), Universität Stuttgart, Pfaffenwaldring 47, 70569 Stuttgart, Germany; Schubert, M.B. Institut für Physikalische Elektronik (ipe), Universität Stuttgart, Pfaffenwaldring 47, 70569 Stuttgart, Germany; Müller, J. Q-Cells AG, OT Thalheim, Guardianstr. 16, 06766 Bitterfeld-Wolfen, Germany; Hlusiak, M. Q-Cells AG, OT Thalheim, Guardianstr. 16, 06766 Bitterfeld-Wolfen, Germany; Merz, R. Institut für Physikalische Elektronik (ipe), Universität Stuttgart, Pfaffenwaldring 47, 70569 Stuttgart, Germany; Werner, J.H. Institut für Physikalische Elektronik (ipe), Universität Stuttgart, Pfaffenwaldring 47, 70569 Stuttgart, Germany (2015-01-20)
  • Jones, Ian M. Insect Research & Development Limited, 6 Quy Court, Colliers Lane, Stow-cum-Quy, Cambridge CB25 9AU, UK; Burgess, Ian F. Insect Research & Development Limited, 6 Quy Court, Colliers Lane, Stow-cum-Quy, Cambridge CB25 9AU, UK ian@insectresearch.com; Brunton, Elizabeth R. Insect Research & Development Limited, 6 Quy Court, Colliers Lane, Stow-cum-Quy, Cambridge CB25 9AU, UK (2015-01-26)
  • Cichoszewski, J. Steinbeis Center Photovoltaics, Rotebühlstr. 145, 70197 Stuttgart, Germany jakub.cichoszewski@stw.de; Werner, J.H. Steinbeis Center Photovoltaics, Rotebühlstr. 145, 70197 Stuttgart, Germany Institute for Photovoltaics ( ipv ), University of Stuttgart, Pfaffenwaldring 47, D-70569 Stuttgart, Germany; Reuter, M. Steinbeis Center Photovoltaics, Rotebühlstr. 145, 70197 Stuttgart, Germany (2015-01-20)
  • Pellegrini, R. Chimet SpA—Catalyst Division, Via di Pescaiola 74, I-52041 Viciomaggio (Arezzo), Italy riccardo.pellegrini@chimet.com; Agostini, G. Department of Inorganic, Physical and Materials Chemistry, INSTM Reference Center and NIS Centre of Excellence, Università di Torino, Via P. Giuria 7, I-10125 Torino, Italy; Groppo, E. Department of Inorganic, Physical and Materials Chemistry, INSTM Reference Center and NIS Centre of Excellence, Università di Torino, Via P. Giuria 7, I-10125 Torino, Italy; Piovano, A. Department of Inorganic, Physical and Materials Chemistry, INSTM Reference Center and NIS Centre of Excellence, Università di Torino, Via P. Giuria 7, I-10125 Torino, Italy; Leofanti, G. Chimet SpA—Catalyst Division, Via di Pescaiola 74, I-52041 Viciomaggio (Arezzo), Italy Consultant, Via Firenze 43, 20010 Canegrate (Milano), Italy; Lamberti, C. Department of Inorganic, Physical and Materials Chemistry, INSTM Reference Center and NIS Centre of Excellence, Università di Torino, Via P. Giuria 7, I-10125 Torino, Italy (2015-01-09)
  • Kuscer, Danjela Jozef Stefan Institute, Jamova 39, SI-1000 Ljubljana, Slovenia danjela.kuscer@ijs.si; Kosec, Marija Jozef Stefan Institute, Jamova 39, SI-1000 Ljubljana, Slovenia (2015-01-21)
  • Tan, Chee Kiang Ivan Institute of Materials Research and Engineering, A*STAR (Agency for Science, Technology and Research), 3 Research Link, Singapore 117602, Singapore School of Materials Science and Engineering, Nanyang Technological University, Nanyang Avenue 50, Singapore 639798, Singapore; Goh, Phoi Chin Institute of Materials Research and Engineering, A*STAR (Agency for Science, Technology and Research), 3 Research Link, Singapore 117602, Singapore; Ma, Jan School of Materials Science and Engineering, Nanyang Technological University, Nanyang Avenue 50, Singapore 639798, Singapore Temasek Laboratories@NTU, Research TechnoPlaza, 50 Nanyang Drive, Singapore 637553, Singapore; Yao, Kui Institute of Materials Research and Engineering, A*STAR (Agency for Science, Technology and Research), 3 Research Link, Singapore 117602, Singapore k-yao@imre.a-star.edu.sg (2015-01-14)
  • Liu, Chao Department of Materials Science and Engineering, Sichuan University, Chengdu 610064, China; Huang, Tao Department of Materials Science and Engineering, Sichuan University, Chengdu 610064, China; Xiao, Dingquan Department of Materials Science and Engineering, Sichuan University, Chengdu 610064, China nic0402@scu.edu.cn; Wu, Jiagang Department of Materials Science and Engineering, Sichuan University, Chengdu 610064, China; Li, Fangxu Department of Materials Science and Engineering, Sichuan University, Chengdu 610064, China; Zhu, Jianguo Department of Materials Science and Engineering, Sichuan University, Chengdu 610064, China (2015-01-26)
  • Desiris, K.A.; Simbilidis, G.; Stergiou, E.; Kiziridou, A.; Voyatzi, S.; Tremmas, I.; Stravoravdi, P.; Paikos, D. (2015-01-22)
  • Chen, F.; Hou, M.; Yang, S.; Chang, S.; Ou-Yang, F. (2015-01-22)
  • Tanaka, H.; Katano, M.; Kubo, M.; Kai, M.; Nakamura, M. (2015-01-22)

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