Na, Yuanyuan
Center for Condensed Matter and Materials Physics, Key Laboratory of Micro-Naro Measurement, Manipulation and Physics, Beihang University, Beijing 100191, PR China; Chu, Lihua
Center for Condensed Matter and Materials Physics, Key Laboratory of Micro-Naro Measurement, Manipulation and Physics, Beihang University, Beijing 100191, PR China; Wang, Cong
Center for Condensed Matter and Materials Physics, Key Laboratory of Micro-Naro Measurement, Manipulation and Physics, Beihang University, Beijing 100191, PR China
Congwang@buaa.edu.cn; Ding, Lei
Center for Condensed Matter and Materials Physics, Key Laboratory of Micro-Naro Measurement, Manipulation and Physics, Beihang University, Beijing 100191, PR China; Ji, Nian
The Center of Micromagnetic and Information Technology, Electronic and Computer Engineering Department, University of Minnesota, Minneapolis, 55455, USA; Wang, Jian-ping
The Center of Micromagnetic and Information Technology, Electronic and Computer Engineering Department, University of Minnesota, Minneapolis, 55455, USA; Chen, Xiaolong
Institute of Physics, Chinese Academy of Science, Beijing 100191, PR China
(2015-01-12)