Yan, Hurui
Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, 500 Dongchuan Road, Shanghai 200241, China; He, Jun
Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, 500 Dongchuan Road, Shanghai 200241, China; Deng, Hongmei
Laboratory for Microstructures, Shanghai University, 99 Shangda Road, Shanghai 200444, China; Chu, Junhao
Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, 500 Dongchuan Road, Shanghai 200241, China; Peng, Lin
Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, 500 Dongchuan Road, Shanghai 200241, China; Ding, Nuofan
Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, 500 Dongchuan Road, Shanghai 200241, China; Yang, Pingxiong
Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, 500 Dongchuan Road, Shanghai 200241, China
pxyang@ee.ecnu.edu.cn; Sun, Lin
Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, 500 Dongchuan Road, Shanghai 200241, China
(2015-01-12)