Liu, Jian
Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, 500 Dongchuan Road, Shanghai 200241, China; Zhai, Xuezhen
Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, 500 Dongchuan Road, Shanghai 200241, China; Cao, Huiyi
Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, 500 Dongchuan Road, Shanghai 200241, China; Chu, Junhao
Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, 500 Dongchuan Road, Shanghai 200241, China; Tao, Jiahua
Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, 500 Dongchuan Road, Shanghai 200241, China; Deng, Hongmei
Instrumental Analysis and Research Center, Institute of Materials, Shanghai University, 99 Shangda Road, Shanghai 200444, China; Sun, Lin
Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, 500 Dongchuan Road, Shanghai 200241, China; Yang, Pingxiong
Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, 500 Dongchuan Road, Shanghai 200241, China
pxyang@ee.ecnu.edu.cn
(2015-01-26)