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Thickness effects of Bi 0.89 Ti 0.11 FeO 3 thin films deposited on PbZr 0.2 Ti 0.79 Nb 0.01 O 3 buffer layers

Chen, X.M. School of Materials Science and Engineering, University of Jinan, Jinan 250022, China; Hu, G.D. School of Materials Science and Engineering, University of Jinan, Jinan 250022, China gdhu@ujn.edu.cn; Wu, W.B. School of Materials Science and Engineering, University of Jinan, Jinan 250022, China; Cheng, L. School of Materials Science and Engineering, University of Jinan, Jinan 250022, China; Wang, J.C. School of Materials Science and Engineering, University of Jinan, Jinan 250022, China; Yang, C.H. School of Materials Science and Engineering, University of Jinan, Jinan 250022, China (2015-01-20)
Effect of niobium dopant on fatigue characteristics of BiFeO 3 thin films grown on Pt electrodes

Simões, A.Z. Chemistry Institute, Department of Chemistry Physics, UNESP, Rua Prof. Francisco Degni, s/n, Quitandinha, CEP:14800-900, Araraquara, SP, Brazil alezipo@yahoo.com; Varela, J.A. Chemistry Institute, Department of Chemistry Physics, UNESP, Rua Prof. Francisco Degni, s/n, Quitandinha, CEP:14800-900, Araraquara, SP, Brazil; Pianno, R.F. Chemistry Institute, Department of Chemistry Physics, UNESP, Rua Prof. Francisco Degni, s/n, Quitandinha, CEP:14800-900, Araraquara, SP, Brazil; Aguiar, E.C. Chemistry Institute, Department of Chemistry Physics, UNESP, Rua Prof. Francisco Degni, s/n, Quitandinha, CEP:14800-900, Araraquara, SP, Brazil; Longo, E. Chemistry Institute, Department of Chemistry Physics, UNESP, Rua Prof. Francisco Degni, s/n, Quitandinha, CEP:14800-900, Araraquara, SP, Brazil (2015-01-20)
Effects of annealing temperature on the microstructure, electrical properties of Fe-doped Na 0.5 Bi 0.5 TiO 3 thin films

Sui, Huiting School of Materials Science and Engineering, University of Jinan, Jinan 250022, China; Lin, Weiqiang School of Materials Science and Engineering, University of Jinan, Jinan 250022, China; Yang, Changhong School of Materials Science and Engineering, University of Jinan, Jinan 250022, China Shandong Provincial Key Laboratory of Preparation and Measurement of Building Materials, University of Jinan, Jinan 250022, China State Key Laboratory of Crystal Materials, Shandong University, Jinan 250100, China mse_yangch@ujn.edu.cn; Zhao, Mingshi School of Materials Science and Engineering, University of Jinan, Jinan 250022, China; Feng, Chao School of Materials Science and Engineering, University of Jinan, Jinan 250022, China (2015-01-26)
Piezoresponse behavior of niobium doped bismuth ferrite thin films grown by chemical method

Simões, A.Z. Universidade Federal de Itajubá - UNIFEI, Campus de Itabira, Rua São Paulo, 377, Bairro Amazonas, Itabira, MG, CEP 35900-373, Brazil alezipo@yahoo.com; Riccardi, C.S. Laboratório Interdisciplinar em Cerâmica, Departamento de Físico-Química, Instituto de Química Universidade Estadual Paulista, Bairro Quitandinha, Araraquara, SP, CEP 14800-900, Brazil; Garcia, Filiberto Gonzalez Universidade Federal de Itajubá - UNIFEI, Campus de Itabira, Rua São Paulo, 377, Bairro Amazonas, Itabira, MG, CEP 35900-373, Brazil (2015-01-20)
Structural and multiferroic properties of the Ce-doped BiFeO 3 thin films

Liu, Jun Department of Electronic Science and Technology, School of Physical Science and Technology, Wuhan University, Wuhan 430072, PR China Key Laboratory of Acoustic and Photonic Material and Device of the Ministry of Education, Wuhan University, Wuhan 430072, PR China; Li, Meiya Department of Electronic Science and Technology, School of Physical Science and Technology, Wuhan University, Wuhan 430072, PR China Key Laboratory of Acoustic and Photonic Material and Device of the Ministry of Education, Wuhan University, Wuhan 430072, PR China myli@whu.edu.cn; Pei, Ling Department of Electronic Science and Technology, School of Physical Science and Technology, Wuhan University, Wuhan 430072, PR China Key Laboratory of Acoustic and Photonic Material and Device of the Ministry of Education, Wuhan University, Wuhan 430072, PR China; Wang, Jing Department of Electronic Science and Technology, School of Physical Science and Technology, Wuhan University, Wuhan 430072, PR China Key Laboratory of Acoustic and Photonic Material and Device of the Ministry of Education, Wuhan University, Wuhan 430072, PR China; Yu, Benfang Department of Electronic Science and Technology, School of Physical Science and Technology, Wuhan University, Wuhan 430072, PR China Key Laboratory of Acoustic and Photonic Material and Device of the Ministry of Education, Wuhan University, Wuhan 430072, PR China; Wang, Xiao Department of Electronic Science and Technology, School of Physical Science and Technology, Wuhan University, Wuhan 430072, PR China; Zhao, Xingzhong Department of Electronic Science and Technology, School of Physical Science and Technology, Wuhan University, Wuhan 430072, PR China Key Laboratory of Acoustic and Photonic Material and Device of the Ministry of Education, Wuhan University, Wuhan 430072, PR China (2015-01-20)

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