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Preparation and properties of p-type Ag-doped ZnMgO thin films by pulsed laser deposition

Cao, Ling State Key Laboratory of Silicon Materials, Department of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, People's Republic of China; Zhu, Liping State Key Laboratory of Silicon Materials, Department of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, People's Republic of China zlp1@zju.edu.cn; Ye, Zhizhen State Key Laboratory of Silicon Materials, Department of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, People's Republic of China; Jiang, Jie State Key Laboratory of Silicon Materials, Department of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, People's Republic of China; Zhang, Yinzhu State Key Laboratory of Silicon Materials, Department of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, People's Republic of China; Li, Yang State Key Laboratory of Silicon Materials, Department of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, People's Republic of China (2015-01-20)
Improved dielectric and ferroelectric properties in Ti-doped BiFeO 3 –PbTiO 3 thin films prepared by pulsed laser deposition

Chen, Ling Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education, Xi'an Jiaotong University, Xi'an 710049, China Department of Chemistry and 4D LABS, Simon Fraser University, Burnaby, British Columbia, Canada V5A 1S6; Ren, Wei Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education, Xi'an Jiaotong University, Xi'an 710049, China wren@mail.xjtu.edu.cn; Yao, Xi Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education, Xi'an Jiaotong University, Xi'an 710049, China; Ye, Zuo-Guang Department of Chemistry and 4D LABS, Simon Fraser University, Burnaby, British Columbia, Canada V5A 1S6 Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education, Xi'an Jiaotong University, Xi'an 710049, China zye@sfu.ca; Zhu, Weimin Department of Chemistry and 4D LABS, Simon Fraser University, Burnaby, British Columbia, Canada V5A 1S6; Chen, Xiaofeng Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education, Xi'an Jiaotong University, Xi'an 710049, China; Wu, Xiaoqing Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education, Xi'an Jiaotong University, Xi'an 710049, China; Shi, Peng Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education, Xi'an Jiaotong University, Xi'an 710049, China (2015-01-10)
Growth and characterization of Bi 2 Se 3 thin films by pulsed laser deposition using alloy target

Meng, Lijian Departamento de Física, Instituto Superior de Engenharia do Porto, Rua Dr. António Bernardino de Almeida, 431, 4200-072 Porto, Portugal Centro de Física, Universidade do Minho, 4800-058 Guimarães, Portugal ljm@isep.ipp.pt; Zhang, Zhidong Shenyang National Laboratory for Material Science, Institute of Metal Research, Chinese Academy of Sciences, 72 Wenhua Road, Shenyang 110016, People's Republic of China; Gong, Wenjie Shenyang National Laboratory for Material Science, Institute of Metal Research, Chinese Academy of Sciences, 72 Wenhua Road, Shenyang 110016, People's Republic of China; Meng, Hui Shenyang National Laboratory for Material Science, Institute of Metal Research, Chinese Academy of Sciences, 72 Wenhua Road, Shenyang 110016, People's Republic of China; Liu, Wei Shenyang National Laboratory for Material Science, Institute of Metal Research, Chinese Academy of Sciences, 72 Wenhua Road, Shenyang 110016, People's Republic of China (2015-01-10)
Reduction of microwave dielectric losses in KTa 1 − x Nb x O 3 thin films by MgO-doping

Simon, Q. Sciences Chimiques de Rennes, UMR 6226 CNRS/Université de Rennes 1, Campus de Beaulieu, 35042 Rennes Cedex, France; Houdonougbo, F. XLIM, UMR CNRS 6172, 123, avenue A. Thomas, 87060 Limoges Cedex, France; Le Floch, J.-M. XLIM, UMR CNRS 6172, 123, avenue A. Thomas, 87060 Limoges Cedex, France School of Physics, University of Western Australia, 35 Stirling Hwy, 6009 Crawley, Australia; Peng, W. Sciences Chimiques de Rennes, UMR 6226 CNRS/Université de Rennes 1, Campus de Beaulieu, 35042 Rennes Cedex, France; Guilloux-Viry, M. Sciences Chimiques de Rennes, UMR 6226 CNRS/Université de Rennes 1, Campus de Beaulieu, 35042 Rennes Cedex, France maryline.guilloux-viry@univ-rennes1.fr; Députier, S. Sciences Chimiques de Rennes, UMR 6226 CNRS/Université de Rennes 1, Campus de Beaulieu, 35042 Rennes Cedex, France; Bouquet, V. Sciences Chimiques de Rennes, UMR 6226 CNRS/Université de Rennes 1, Campus de Beaulieu, 35042 Rennes Cedex, France; Cros, D. XLIM, UMR CNRS 6172, 123, avenue A. Thomas, 87060 Limoges Cedex, France; Madrangeas, V. XLIM, UMR CNRS 6172, 123, avenue A. Thomas, 87060 Limoges Cedex, France; Dauscher, A. Laboratoire de Physique des Matériaux, UMR 7556, ENSMN, Parc de Saurupt, CS 14234, 54042 Nancy, France; Weber, S. Laboratoire de Physique des Matériaux, UMR 7556, ENSMN, Parc de Saurupt, CS 14234, 54042 Nancy, France (2015-01-10)

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