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X-ray diffraction, Raman and photoluminescence studies of nanocrystalline cerium oxide thin films

Balakrishnan, G. Department of Mechanical Engineering, Changwon National University, Changwon 641773, South Korea bala_physics76@yahoo.co.uk; Bae, S.I. Department of Mechanical Engineering, Changwon National University, Changwon 641773, South Korea; Ghosh, C. Materials Synthesis and Structural Characterisation Section, Physical Metallurgy Group, Indira Gandhi Centre for Atomic Research, Kalpakkam 603102, India; Raghavan, C.M. Department of Physics, Ferroelectrics Thin film Laboratory, Changwon National University, Changwon 641773, South Korea; Divakar, R. Materials Synthesis and Structural Characterisation Section, Physical Metallurgy Group, Indira Gandhi Centre for Atomic Research, Kalpakkam 603102, India; Mohandas, E. Materials Synthesis and Structural Characterisation Section, Physical Metallurgy Group, Indira Gandhi Centre for Atomic Research, Kalpakkam 603102, India; Song, Jung Il Department of Mechanical Engineering, Changwon National University, Changwon 641773, South Korea jisong@changwon.ac.kr; Gyu Kim, Tae Department of Nanomechatronics Engineering, Pusan National University, Miryang-si 627706, South Korea (2015-01-14)
Effects of temperature on structural and morphological features of CoPc and CoPcF 16 thin films

Schuster, Britt-Elfriede Institute of Physical and Theoretical Chemistry, University of Tübingen, Germany; Plyashkevich, Vladimir A. Nikolaev Institute of Inorganic Chemistry, Novosibirsk, Russia; Peisert, Heiko Institute of Physical and Theoretical Chemistry, University of Tübingen, Germany; Basova, Tamara V. Nikolaev Institute of Inorganic Chemistry, Novosibirsk, Russia basova@niic.nsc.ru; Chassé, Thomas Institute of Physical and Theoretical Chemistry, University of Tübingen, Germany (2015-01-10)
Study of YBaCo 4 O 7 + δ thin films grown by sputtering technique on (1012)-oriented sapphire substrates

Montoya, J.F. Laboratorio de Materiales Cerámicos y Vítreos, Departamento de Física, Universidad Nacional de Colombia, Sede Medellín, A.A. 568, Medellín, Colombia; Gómez, A. Laboratorio de Caracterización de Materiales, Facultad de Minas, Universidad Nacional de Colombia, Sede Medellín, A.A. 568, Medellín, Colombia; Morán, O. Laboratorio de Materiales Cerámicos y Vítreos, Departamento de Física, Universidad Nacional de Colombia, Sede Medellín, A.A. 568, Medellín, Colombia omoranc@unal.edu.co; Arnache, O. Grupo de Estado Sólido, Departamento de Física, Universidad de Antioquia, A.A. 1226 Medellín, Colombia; Izquierdo, J.L. Laboratorio de Materiales Cerámicos y Vítreos, Departamento de Física, Universidad Nacional de Colombia, Sede Medellín, A.A. 568, Medellín, Colombia; Osorio, J. Grupo de Estado Sólido, Departamento de Física, Universidad de Antioquia, A.A. 1226 Medellín, Colombia; Paucar, C. Laboratorio de Materiales Cerámicos y Vítreos, Departamento de Física, Universidad Nacional de Colombia, Sede Medellín, A.A. 568, Medellín, Colombia; Marín, J. Laboratorio de Materiales Cerámicos y Vítreos, Departamento de Física, Universidad Nacional de Colombia, Sede Medellín, A.A. 568, Medellín, Colombia (2015-01-10)
Effect of deposition temperature on the properties of CeO 2 films grown by atomic layer deposition

King, P.J. Department of Materials, University of Liverpool, George Holt building, L69 3BX, UK p.j.king@liverpool.ac.uk; Jones, A.C. Department of Chemistry, University of Liverpool, Crown Street, L69 7ZD, UK; Chalker, P.R. Department of Materials, University of Liverpool, George Holt building, L69 3BX, UK; Werner, M. Department of Materials, University of Liverpool, George Holt building, L69 3BX, UK; Aspinall, H.C. Department of Chemistry, University of Liverpool, Crown Street, L69 7ZD, UK; Basca, J. Department of Chemistry, University of Liverpool, Crown Street, L69 7ZD, UK; Davies, H.O. SAFC Hitech Power Road, Bromborough, Wirral, Merseyside, CH62 3QF, UK; Black, K. Department of Chemistry, University of Liverpool, Crown Street, L69 7ZD, UK; Wrench, J.S. Department of Chemistry, University of Liverpool, Crown Street, L69 7ZD, UK; Heys, P.N. SAFC Hitech Power Road, Bromborough, Wirral, Merseyside, CH62 3QF, UK (2015-01-10)
Cr 2 O 3 thin films grown at room temperature by low pressure laser chemical vapour deposition

Sousa, P.M. Universidade de Lisboa, Faculdade de Ciências, Departamento de Física and ICEMS, Campo Grande, Ed. C8, 1749-016 Lisboa, Portugal; Silvestre, A.J. Instituto Superior de Engenharia de Lisboa and ICEMS, R. Conselheiro Emídio Navarro 1, 1959-007 Lisboa, Portugal asilvestre@deq.isel.ipl.pt; Conde, O. Universidade de Lisboa, Faculdade de Ciências, Departamento de Física and ICEMS, Campo Grande, Ed. C8, 1749-016 Lisboa, Portugal (2015-01-10)
Effect of samarium addition and annealing on the properties of electrodeposited ceria thin films

Żivković, L. Laboratoire d'Electrochimie, Chimie des Interfaces et Modélisation pour l'Énergie, LECIME, CNRS UMR 7575, Chimie ParisTech (ENSCP)-Paris, 11 rue Pierre et Marie Curie, 75231 Paris cedex 05, France The Vinča Institute of Nuclear Sciences, University of Belgrade, 11 001 Belgrade, PO BOX 522, Serbia; Lupan, O. Laboratoire d'Electrochimie, Chimie des Interfaces et Modélisation pour l'Énergie, LECIME, CNRS UMR 7575, Chimie ParisTech (ENSCP)-Paris, 11 rue Pierre et Marie Curie, 75231 Paris cedex 05, France Department of Microelectronics and Semiconductor Devices, Technical University of Moldova, 168 Stefan cel Mare Blvd., Chisinau, MD-2004, Republic of Moldova; Ringuedé, A. Laboratoire d'Electrochimie, Chimie des Interfaces et Modélisation pour l'Énergie, LECIME, CNRS UMR 7575, Chimie ParisTech (ENSCP)-Paris, 11 rue Pierre et Marie Curie, 75231 Paris cedex 05, France; Lair, V. Laboratoire d'Electrochimie, Chimie des Interfaces et Modélisation pour l'Énergie, LECIME, CNRS UMR 7575, Chimie ParisTech (ENSCP)-Paris, 11 rue Pierre et Marie Curie, 75231 Paris cedex 05, France virginie-lair@ens.chimie-paristech.fr (2015-01-10)
Control of oxidation state of copper in flame deposited films

Hadzifejzovic, E. Department of Chemistry, University College London, 20 Gordon St., London, WC1H 0AJ, UK; Caruana, D.J. Department of Chemistry, University College London, 20 Gordon St., London, WC1H 0AJ, UK d.j.caruana@ucl.ac.uk; Elahi, A. Department of Chemistry, University College London, 20 Gordon St., London, WC1H 0AJ, UK (2015-01-10)
Carbonized tantalum catalysts for catalytic chemical vapor deposition of silicon films

Cheng, Shimin State Key Laboratory of Catalysis, Dalian Institute of Chemical Physics, Chinese Academy of Sciences, Dalian 116023, China Dalian National Laboratory for Clean Energy, Dalian 116023, China Graduate University of Chinese Academy of Sciences, Beijing 100049, China; Ying, Pinliang State Key Laboratory of Catalysis, Dalian Institute of Chemical Physics, Chinese Academy of Sciences, Dalian 116023, China Dalian National Laboratory for Clean Energy, Dalian 116023, China; Li, Can State Key Laboratory of Catalysis, Dalian Institute of Chemical Physics, Chinese Academy of Sciences, Dalian 116023, China Dalian National Laboratory for Clean Energy, Dalian 116023, China canli@dicp.ac.cn; Gao, Huiping State Key Laboratory of Catalysis, Dalian Institute of Chemical Physics, Chinese Academy of Sciences, Dalian 116023, China Dalian National Laboratory for Clean Energy, Dalian 116023, China; Ren, Tong State Key Laboratory of Catalysis, Dalian Institute of Chemical Physics, Chinese Academy of Sciences, Dalian 116023, China Dalian National Laboratory for Clean Energy, Dalian 116023, China (2015-01-10)
Effects of working pressure and substrate temperature on the structure and mechanical properties of nanocrystalline SiC thin films deposited by bias-enhanced hot filament chemical vapor deposition

Liu, Zhong Li Key Laboratory of Materials Modification by Laser, Ion, and Electron Beams, Dalian University of Technology, Ministry of Education, Dalian 116024, China School of Materials Science and Engineering, Dalian University of Technology, Dalian 116024, China; Xiang, Li Key Laboratory of Materials Modification by Laser, Ion, and Electron Beams, Dalian University of Technology, Ministry of Education, Dalian 116024, China School of Materials Science and Engineering, Dalian University of Technology, Dalian 116024, China xiangli2035@sina.com (2015-01-27)
Composition variations in Cu 2 ZnSnSe 4 thin films analyzed by X-ray diffraction, energy dispersive X-ray spectroscopy, particle induced X-ray emission, photoluminescence, and Raman spectroscopy

Nam, Dahyun Department of Physics, Sogang University, Seoul 121-742, Republic of Korea; Ponomarev, A.G. Department of Electronics and Computer Technology, Sumy State University, Sumy UA-40007, Ukraine; Opanasyuk, A.S. Department of Electronics and Computer Technology, Sumy State University, Sumy UA-40007, Ukraine; Cheong, Hyeonsik Department of Physics, Sogang University, Seoul 121-742, Republic of Korea hcheong@sogang.ac.kr; Jeong, Ah Reum Department of Physics, Ewha Womans University, Seoul 120-750, Republic of Korea; Koval, P.V. Department of Electronics and Computer Technology, Sumy State University, Sumy UA-40007, Ukraine; Jo, William Department of Physics, Ewha Womans University, Seoul 120-750, Republic of Korea; Kim, Gee Yeong Department of Physics, Ewha Womans University, Seoul 120-750, Republic of Korea (2015-01-27)

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